Teradyne, Inc. has introduced Iris 100, a production-ready optical test platform designed to bring semiconductor-grade optical testing to microLED manufacturing. The system measures individual emitters across microLED arrays and integrates with Teradyne’s UltraFLEXplus platform, enabling combined optical and electrical testing for high-volume production. MicroLED technology is increasingly used in augmented reality (AR) microdisplays and optical data interconnects for AI data centers, where devices can contain hundreds of thousands to millions of emitters requiring precise characterization at production throughput. Iris 100 uses a spectrometer and high-resolution camera to measure spectral response, per-pixel luminance and uniformity, while parallelized testing and image-processing algorithms enable high-throughput characterization of arrays containing millions of microLEDs.
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Leveraging Teradyne’s IG-XL software, the platform can identify optical defects, including dead or stuck pixels and cluster defects, earlier in manufacturing. Its NIST-traceable calibration workflow supports absolute measurements across lots, wafers and manufacturing sites. “MicroLED is shifting from lab to volume production for both AR microdisplays and, increasingly, optical interconnects, which are becoming foundational to how AI data centers scale beyond copper,” said Shannon Poulin, president of the Semiconductor Test division at Teradyne. “Both technologies demand per-emitter test at production throughput, and Iris 100 delivers that today on test infrastructure our customers already run at scale.” Iris 100 supports wafer and final test, with a roadmap for photodetector testing and builds on Teradyne’s Photon 100 and 2025 acquisition of Quantifi Photonics.
