PDF Solutions, a leading provider of comprehensive data solutions for the semiconductor and electronics ecosystems, announced the launch of a freemium entry point for its Exensio Analytics Platform, providing users a new way to start using and experience the market-leading analytics platform.
At this entry point, users can access and use limited, off-line features of the Exensio Analytics Platform for insights into their yield and test operations through a thin client architecture. This will give them access to a subset of offline data anytime, anywhere. It provides highly-interactive tools designed to quickly identify and characterize yield and test problems, drill down into their root causes, and templates to create rules for outlier detection and escape prevention. Built on a big data structure, the Exensio Analytics Platform is designed to power fast, high-volume, scalable storage and analysis, and automate data wrangling, integration, and alignment.
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New users or existing customers can utilize the freemium option to try new applications before they buy. The freemium-level Exensio Analytics Platform includes the following functionality:
- Exensio Manufacturing Analytics is designed to provide efficient yield monitoring and powerful tools for root cause analysis and automation and reporting for new product introduction and production yield management.
- Exensio Test Operations Lite is designed to monitor and optimize test programs, equipment, and outlier detection for test operations analytics and optimization.
- Exensio Automation and Reporting is designed to provide out-of-the-box reporting templates for management level reporting.
“Our launch of the freemium level is targeting both green and brown field customers that are interested in optimizing their SOC backend flow. This allows our potential customer to access a powerful big data platform for free, and gives them a migration path to grow in the Exensio Analytics Platform,” said Peter Szalay, VP Business Development at PDF Solutions.
SOURCE : GlobeNewswire