Monday, December 23, 2024

Neuralink Selects New Takano Wafer Particle Measurement System from ClassOne Equipment

ClassOne Equipment, has announced the sale of its advanced new Takano particle measurement system to Neuralink Corp., the California-based developer of leading-edge brain-computer interfaces. The announcement was made by ClassOne Equipment’s Vice President, David Pawlak.

“Neuralink chose the Takano WM-7SR system for high-precision wafer particle detection in their 150mm fab in Fremont, California,” said Pawlak. “The tool was selected after it performed successfully on a range of tests on Neuralink bare-silicon and blanket-filmed wafers. The equipment’s extensive functionality as well as its attractive price and delivery time were also key factors in the company’s final decision.”

Also Read: Darling Ingredients Named ESG Industry Top Rated Company Again by Morningstar Sustainalytics

Pawlak pointed out that Takano-brand particle detection systems are rapidly gaining attention in the semiconductor industry because they have become the new-technology replacement for legacy Surfscan systems. The Takano WM-7SR is specifically designed to deliver advanced particle measurements on ≤200mm unpatterned wafers. The tool is capable of providing best-in-class detection sensitivity along with high throughput, excellent repeatability and a suite of options that includes Map Overlay, Haze Measurements, X/Y Coordinate Output, and more.

ClassOne Equipment is the exclusive source for sales, service and complete support of Takano particle detection systems in North America and Europe. ClassOne maintains a team of specially-trained field engineers to provide installations, PMs and all other services on Takano systems.

Neuralink is a developer of ultra-high bandwidth brain-machine interfaces to connect humans and computers. The company’s fully implantable, cosmetically invisible brain-computer interfaces will allow people with paralysis to regain independence through the control of computers and mobile devices.

SOURCE: PR Newswire

Subscribe Now

    Hot Topics