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Onto Innovation

Onto Innovation Launches Next Generation OCD Metrology Platform to Enable Process Control for Advanced AI Devices

Onto Innovation, introduced the Atlas G6 optical critical dimension (OCD) metrology system, designed to address the growing complexity of process control in advanced semiconductor nodes....

Onto Innovation’s 4Di InSpec™ Automated Metrology System Receives 2024 Innovative System of the Year Award from FANUC America

Onto Innovation Inc., and its Tucson subsidiary 4D Technology, announced they’ve been named winner of FANUC America’s prestigious 2024 Innovative System of the Year...
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